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AMC-Monitor T-1000: all-in-one analyzer for the semiconductor industry

AMC-Monitor T-1000: all-in-one analyzer for the semiconductor industry

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Real-time VOC monitoring in FOUP, fab and the clean-room environment Airborne Molecular Contamination (AMC) is more and more taking center stage in today’s semiconductor manufacturing processes. In the past the focus was on filtering particles from the ambient air in the clean-room to reduce their negative impact on production yield. Using  expensive air filtration equipment and transport […]